Google Scholar Profile
- Mingyuan Xiang, Xuhan Xie, Pedro Savarese, Xin Yuan, Michael Maire, and Yanjing Li, “Drop-Connect as a Fault-Tolerance Approach for RRAM-based Deep Neural Network Accelerators,” Proc. IEEE VLSI Test Symposium (VTS), 2024 (to appear).
- Cyrus Zhou, Zack Hassman, Dhirpal Shah, Vaughn Richard, and Yanjing Li, “YFlows: Systematic Dataflow Exploration and Code Generation for Efficient Neural Network Inference using SIMD Architectures on CPUs,” Proc. 33rd ACM SIGPLAN International Conference on Compiler Construction (CC), 2024. [paper]
- Yuqing Wang, Andronicus Rajasukumar, Tianshuo Su, Marziyeh Nourian, Jose M Monsalve Diaz, Ahsan Pervaiz, Jerry Ding, Charles Colley, Wenyi Wang, Yanjing Li, David F. Gleich, Hank Hoffmann, and Andrew A. Chien, "Efficiently Exploiting Irregular Parallelism Using Keys at Scale," Workshop on Languages and Compilers for Parallel Computing, 2023. [paper]
- Yi He, Mike Hutton, Steven Chan, Robert de Gruijl, Rama Govindaraju, Nishant Patil, and Yanjing Li, “Understanding and Mitigating Hardware Failures in Deep Learning Training Accelerator Systems,” Proc. International Symposium on Computer Architecture (ISCA), 2023. [paper][slides][lightning video][lightning slides]
- Yi He, and Yanjing Li, “Understanding Permanent Hardware Failure Effects in Deep Learning Training Systems,” Proc. European Test Conference (ETS), 2023. [paper][slides][video]
- Yuming Liu, Angel Yanguas-Gil, Sandeep Madireddy, and Yanjing Li, "Memristor-Spikelearn: A Spiking Neural Network Simulator for Studying Synaptic Plasticity under Realistic Memristor Behaviors," IEEE Design, Automation, and Test in Europe Conference (DATE), 2023. [paper] [slides] [talk]
- Pedro Savarese, Xin Yuan, Yanjing Li, and Michael Maire, "Not All Bits have Equal Value: Heterogeneous Precisions via Trainable Noise," Proc. Thirty-Sixth Conference on Neural Information Processing Systems (NeurIPS), 2022. [paper] [slides][poster]
- Takumi Uezono, Yi He, and Yanjing Li, "Achieving Automotive Safety Requirements through Functional In-Field Self-Test for Deep Learning Accelerators," Proc. IEEE International Test Conference (ITC), 2022. [paper] [slides]
- Mehdi Sadi, Yi He, Yanjing Li, Mahabubul Alam, Satwik Kundu, Swaroop Ghosh, Javad Bahrami, and Naghmeh Karimi, “On the Reliability of Conventional and Quantum Neural Network Hardware,” Proc. IEEE VLSI Test Symposium (VTS), 2022 (invited). [paper] [slides] [talk]
- Yi He, Takumi Uezono, and Yanjing Li, "Efficient Functional In-Field Self-Test for Deep Learning Accelerators," Proc. IEEE International Test Conference (ITC), 2021. [paper] [slides]
- Mingdai Yang, Mohammad Reza Jokar, Junyi Qiu, Qiuwen Lou, Yuming Liu, Aditi Udupa, Frederic T. Chong, John M. Dallesasse, Milton Feng, Lynford L. Goddard, X. Sharon Hu, and Yanjing Li, "A Hybrid Optical-Electrical Analog Deep Learning Accelerator Using Incoherent Optical Signals," Proc. ACM Great Lakes Symposium on VLSI (GLSVLSI), 2021. [paper] [slides] [talk]
- Yi He, Prasanna Balaprakash, and Yanjing Li, "FIdelity: Efficient Resilience Analysis Framework for Deep Learning Accelerators," Proc. 53rd IEEE/ACM International Symposium on Microarchitecture (MICRO), 2020. [paper] [slides] [talk]
- Mohammad Reza Jokar, Junyi Qiu, Frederic T. Chong, Lynford L. Goddard, John M. Dallesasse, Milton Feng, and Yanjing Li, "Baldur: A Power-Efficient and Scalable Network Using All-Optical Switches," Proc. IEEE International Symposium on High-Performance Computer Architecture (HPCA), 2020. [paper] [slides]
- Yi He and Yanjing Li, "Time-Slicing Soft Error Resilience in Microprocessors for Reliable and Energy-Efficient Execution," Proc. IEEE International Test Conference (ITC), 2019. [paper] [slides]
- Reza Jokar, Lunkai Zhang, John Dallesasse, Fred Chong, and Yanjing Li, "Direct-Modulated Optical Networks for Interposer Systems," Proc. IEEE/ACM International Symposium on Networks-on-Chip (NOCS), 2019. [paper] [slides]
- Eric Cheng, Daniel-Mueller-Gritschneder, Jacob Abraham, Pradip Bose, Alper Buyuktosunoglu, Deming Chen, Yanjing Li, Uzair Sharif, KevinSkadron, Mircea Stan, Muhammad Shafique, Ulf Schlichtmann, Subhasish Mitra, "Cross-Layer Resilience: Myths, Insights and the Road Ahead," Proc. ACM/EDAC/IEEE Design Automation Conference (DAC), 2019 (invited).
- Yan Verdeja Herms, and Yanjing Li, "Skipping Crashes: A Minimal-Cost Framework for Efficient Error Recovery in Approximate Computing Environments," Proc. ACM Great Lakes Symposium on VLSI (GLSVLSI), 2019. Best Paper Award. [paper] [slides]
- Xinchuan Wu, Timothy Sherwood, Fred Chong, and Yanjing Li, "Protecting Page Tables from RowHammer Attacks using Monotonic Pointers in DRAM True-Cells," Proc. ACM International Conference on Architectural Support for Programming Languages and Operating Systems (ASPLOS), 2019. [paper] [slides] [poster][lightning talk]
- Xi Liang, Yi He, Prasanna Balaprakash, and Yanjing Li, "Machine Learning Guided Application Error Analysis for Efficient Cross-Layer Resilience," ACM/EDAC/IEEE Design Automation Conference (DAC), Latest Breaking Results, 2018.
- Xiaoan Ding, Xi Liang, and Yanjing Li, "Cross-Layer Refresh Mitigation for Efficient and Reliable DRAM Systems: A Comparative Study," Proc. IEEE International Test Conference (ITC), pp. 1-10, 2017. [paper] [slides]
- David Lin, Ted Hong, Yanjing Li, S Eswaran, Sharad Kumar, Farzan Fallah, Nagib Hakim, Donald S. Gardner, and Subhasish Mitra, "Effective Post Silicon Validation of System-on-Chips using Quick Error Detection," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 33, no. 10, pp. 1573-1590, 2014.
- Subhasish Mitra, Pradip Bose, Eric Cheng, Chen-Yong Cher, Hyungmin Cho, Rajiv Joshi, Young Moon Kim, Charles R. Lefurgy, Yanjing Li, Kenneth P. Rodbell, Kevin Skadron, James Stathis, and LLukasz Szafaryn, "The Resilience Wall: Cross-Layer Solution Strategies," Proc. IEEE International Symposium on VLSI Technology, Systems and Applications and IEEE International Symposium on VLSI Design, Automation and Test, pp. 1-11, 2014 (Invited).
- Yanjing Li, Eric Cheng, Samy Makar and Subhasish Mitra, "Self-Repair of Uncore Components in Robust System-on-Chips: An OpenSPARC T2 Case Study," Proc. IEEE International Test Conference (ITC), pp. 1-10, 2013.
- David Lin, Ted Hong, Yanjing Li, Farzan Fallah, Donald S. Gardner, Nagib Hakim, and Subhasish Mitra, "Overcoming Post-Silicon Validation Challenges through Quick Error Detection (QED)," Proc. IEEE/ACM Design Automation and Test in Europe (DATE), pp. 320-325, 2013 (Invited).
- Subhasish Mitra, Kevin Brelsford, Young Moon Kim, Hsiao-Heng Kelin Lee, and Yanjing Li, "Robust System Design to Overcome CMOS Reliability Challenges," IEEE Journal on Emerging and Selected Topics in Circuits and Systems, Special Issue on the IEEE CAS Forum on Emerging and Selected Topics, vol. 1, no. 1, pp. 30-41, 2011 (Invited).
- Subhasish Mitra, Hyungmin Cho, Ted Hong, Young Moon Kim, Hsiao-Heng Kelin Lee, Larkhoon Leem, Yanjing Li, David Lin, Evelyn Mintarno, Diana Mui, Sung-Boem Park, Nashant Patil, Hai Wei, and Jie Zhang, "Robust System Design," IPSJ Trans. System LSI Design Methodology, 2011 (Invited).
- Larkhoon Leem, Hyungmin Cho, Young Moon Kim, Hsiao-Heng Kelin Lee, Yanjing Li, and Subhasish Mitra, "Cross-Layer Error Resilience for Robust Systems," Proc. IEEE/ACM International Conference on Computer-Aided Design (ICCAD), pp. 177-180, 2010 (Invited).
- Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, and Subhasish Mitra, "QED: Quick Error Detection Tests for Effective Post-Silicon Validation," Proc. IEEE International Test Conference (ITC), pp. 1-10, 2010. Best Student Paper Award.
- Yanjing Li, Onur Mutlu, Donald S. Gardner, and Subhasish Mitra, "Concurrent Autonomous Self-Test for Uncore Components in System-on-Chips," Proc. IEEE VLSI Test Symposium (VTS), pp. 232- 237, 2010. Best Paper Award.
- Yanjing Li, Young Moon Kim, Evelyn Mintarno, Donald S. Gardner, and Subhasish Mitra, "Overcoming Early-Life Failure and Aging Challenges for Robust System Design," IEEE Design and Test of Computers, Special Issue on Design for Reliability and Robustness, vol. 26, no. 6, pp. 28-39, 2009 (invited).
- Yanjing Li, Onur Mutlu, and Subhasish Mitra, "Operating System Scheduling for Efficient Online Self- Test in Robust Systems," Proc. IEEE International Conference on Computer-Aided Design (ICCAD), pp. 201-208, 2009.
- Hiroaki Inoue, Yanjing Li, and Subhasish Mitra, "VAST: Virtualization Assisted Concurrent Autonomous Self-Test," Proc. IEEE International Test Conference (ITC), pp. 1-10, 2008.
- Yanjing Li, Samy Makar, and Subhasish Mitra, "CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns," Proc. IEEE/ACM Design Automation and Test in Europe (DATE), pp. 885-890, 2008.
- Yanjing Li, Zhaosong Lu, and Jeremy J. Michalek, "Diagonal Quadratic Approximation for Parallelization of Analytical Target Cascading," ASME Journal of Mechanical Design, vol. 130, no. 5, pp. 051402-1 - 051402-11, 2008.
- Yanjing Li, Zhaosong Lu, and Jeremy J. Michalek, "Diagonal Quadratic Approximation for Parallelization of Analytical Target Cascading," Proc. ASME International Design Engineering Technical Conferences, pp. 749-760, 2007.